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赛默飞世尔科技(原热电公司)

产品介绍

FT-IR度量工具

价 格:¥电议

型 号: Nicolet ECO 3500

产品完善度:

生产地:其他访问量:755次

发布日期:2009/11/2 0:00:00

更新日期:1900/1/1 0:00:00

详细内容

 ECO 3500 FT-IR Metrology Tool


The ECOTM 3500 features fully automated handling of wafers up to 300 mm. It measures dopant concentration levels in dielectric films (BPSG, PSG, FSG, etc.), hydrogen levels in silicon nitride films, epitaxial film thickness, MEMS device thickness, and substitutional carbon and interstitial oxygen levels in silicon wafers.
   Product Detail


Some of the highlights of the tool include:
  • Fully automated handling of wafers up to 300 mm
  • The only FT-IR metrology tool to utilize Asyst Technologies" new state-of-the-art EFEM, rated ISO class 1 for particle contamination
  • Two in-line load ports
  • Precision edge grip stage provides exceptionally stable and reproducible measurement results with the absolute minimum wafer contamination
  • Powerful FT-IR software toolkit for custom recipe generation
  • SECS/GEM/HSMS communications software
  • Capable of measuring epitaxial film thickness from 300nm to 7,500 nm
  • Flexible measurement options from single point measurements to complete wafer mapping options
  • Measures up to 140 wafers per hour
  • Transmission and reflectance measurement capability to accommodate the widest range of materials and films
  • Completely integrated controller with optional second control station in rear of tool to accommodate bulkhead FAB architectures
  • Support of both ASTM and JEIDA standards

The ECO 3500 improves upon the proven, low cost of ownership and high reliability of our long-running series of ECO tools. Founded on our base of expertise in FT-IR technology, the ECO 3500 is also at the top of its class in performance. Thermo is committed to offering the most expertise, worldwide support and the best possible tools for FT-IR metrology. The ECO 3500 is another affirmation of this commitment.

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